ProductsRF Device

Probe Head for WLCSP/Flip Chip - short pin solution

As an automotive antenna manufacturer, our company has a long history of supplying products to automotive manufacturers, and possesses technical knowledge and manufacturing facilities related to RF products. By leveraging our sophisticated RF system expertise in addition to our fine precision processing technologies, our company offers high performance probeheads at reasonable cost.

Photos are for reference only. Actual design will vary by customer specifications and test environment.

Overview

Application
RF Devices (Wireless tranceiver,etc)
Applicable Package Type
WLCSP(Wafer Level Chip Scale Package) / Flip Chip(Pad, Bump, Cu pillar)
Minimum Pitch
up to 130um
Maximum Pin Count
2mm over
Feartures
  • Short height pin available (~2mm)
  • Capable of handling large pin count : up to 8,000 (8 site)
  • Capable of manufacturing large size package : 100mm x 100mm

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Probe Head for WLCSP/Flip Chip - Coax solution

For wafer probing where high RF performance is required, Yokowo offers probe heads with unique coaxial structure. Yokowo has electrical simulation capability to propose and validate optimized solution for each customer.

Photos are for reference only. Actual design will vary by customer specifications and test environment.

Overview

Application
RF Devices (Wireless tranciever modem,etc)
Applicable Package Type
WLCSP(Wafer Level Chip Scale Package) / Flip Chip(Pad, Bump, Cu pillar)
Pitch
0.4mm~
Feartures
  • Electrical performance simulation is available before fabrication
  • Suitable for high RF testing

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Membrane Type Probe Card - YPX/YPX K

YPX

As mobile phones and other electronic devices evolve at a rapid pace, front-end electronic components such as filters, switches, and amplifiers also evolve at a rapid pace. These applications are typically inspected before they are packaged. To keep up with these trends, our company offers a membrane-type contactor that uses its unique MEMS technology to form bumps on polyimide sheets. This membrane-type contactor reduces ground inductance by minimizing the distance from the contacts to the device, providing a test environment that is as close as possible to the actual usage environment.

YPX K

Photos are for reference only. Actual design will vary by customer specifications and test environment.

Overview

Application
Front end module : Different kinds of filters, amplifiers and switches
Applicable product
Wafer sort testing
Feartures
  • 50ohm impedance matching on the bottom of YPX Tip(50um)
  • Good isolation by placing ground.
  • Capable of placing small components close to DUT
  • RF port(MAX16port)
Min. Pitch 80um(1 or 2 cylinder) 130um (4 cylinder)
Planarity ≦ 10um
Mechanical max over drive ≦ 350um
Spring force / pin ≧ 0.049N (5gf)
Trace L/S 30um/30um
Max. probe area 10x10mm
Number of sites Depends on the device size and layout
Max RF ports YPX:16ports / YPX-K:24ports and more
Frequency YPX:6GHz / YPX-K:40GHz

*YPX-K spec is depending heavily on customer specifications

Capable of testing singulated die


Hand Socket Lid

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Coaxial Socket - for Final Test

  • Plastic sandwich typePlastic sandwich type
  • Insulator ring typeInsulator ring type
  • Simulation imageSimulation image

Photos are for reference only. Actual design will vary by customer specifications and test environment.

For applications that require high RF performance, our company offers coaxial sockets that are ideally suited to your budget and specifications. You can choose from two different socket structures. Yokowo has electrical simulation capability to propose optimized solution for each customer.

Overview

Application
FPGA, ASIC, CPU (PC/Server),Storage, etc
Applicable Package Type
QFN, BGA, LGA, etc
Minimum Pitch
0.4mm~
Maximum Pin Count
Up to 7,000
Feartures
  • Yokowo propose the optimized structure based on electrical simulation.
  • You can select from two different structures.
  • Ideal for high-speed testing and suitable for use in bands from 28 GHz or higher.

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